Ausstattung und Service
Inductively coupled Plasma Mass Spectrometry – ICP-MS (Fa. Agilent)
Elektronenmikroskope REM & TEM inkl. EDX (Fa. Zeiss, Fa. Jeol)
- Scanning Mobility Particle Sizer – SMPS (Fa. TSI)
- Thermogravimetrische Analyse – TGA (Fa. Netzsch)
Fourier-Transformations-Infrarotspektrometer – FTIR (Fa. Bruker)
Accelerated Surface Area and Porosity – ASAP (Fa. Micromeritics)
Aerosol Photoemission Spectroscopy – APES (Eigenentwicklung)
Laser-induced Breakdown Spectroscopy – LIBS (Eigenentwicklung)
Low Pressure Impactor – LPI (Eigenentwicklung, kommerzielle Systeme)
Laser-Doppler-Anemometer & Phasen-Doppler Particle Anemometer – LDA/PDPA (Fa. TSI)